SPS-Europe is proud to offer K-Patents technology to determine the concentration of dissolved solids. K-Patents process refractometers use the optical measurement of a solutions refractive Index. In-line concentration measurement can be used as a real-time predictive tool for the final concentration.
Cost reduction is possible by reducing the variation of mean average of the product concentration.
Download the Application Note on Real-time Chemical Monitoring – Validation of Refractive Index and FT-NIR Technologies in Concentration Measurement of Water in EKC265.Click here
K-Patents Refractometer PR-33-S is the best way to measure concentrations.
Direct optical measurement
No calibration drift
âœ“ Hardcoded parameters
No regular maintenance
- Bulk chemical systems
- KoH etch of silicon
- Post-etch wafer cleaning
- CMP slurries
The K-Patents refractometer offers remote usability with a web browser, as well as a
No measurement error caused by:
- Impurities in ppm-range
Several major fabs worldwide prefer the K-Patents process refractometers for applications in titanium etching, for HNO3 monitoring, for HF/H2SO4/HNO3 monitoring or H2O2monitoring in peroxide, as well as for measuring the DI water content in EKC solvents.