- Suitable for tip head cleaning, less damage on tips
- Good for flap tip cleaning(alloy system cantilever)
- A4 size sheet (228mm x 280 mm)
- Minimum order quantity 10 pieces
- Available in Gray (GC4000, GC6000, GC8000)
The probe card is used during the semiconductor wafer inspection process; after a certain period of use, the needles must be cleaned to maintain their optimum performance. In response to the recent progress of semiconductor performance, needles are diversifying and the pitch is becoming smaller. The importance of this cleaning sheet is only increasing as it is a key factor in prolonging the life of these expensive probe cards; we offer the very best cleaning sheets for the probe card and have an enviable track record with many semiconductor manufactures.